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DeepCornerNet: A Deep Learning Approach for Automated Corner Grading in Trading Cards

- Nahar, Lutfun, Islam, Md. Saiful, Awrangjeb, Mohammad, Verhoeve, Rob, Tuxworth, Gervase

Balancing privacy and utility in cross-company defect prediction

- Peters, Fayola, Menzies, Tim, Gong, Liang, Zhang, Hongyu

Predicting defect numbers based on defect state transition models

- Wang, Jue, Zhang, Hongyu

Dealing with noise in defect prediction

- Kim, Sunghun, Zhang, Hongyu, Wu, Rongxin, Gong, Liang

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